Think ahead
If you use the swap enough that the NAND gets "killed"
do you want a dead section in the middle of the card?
Personally I make swap partitions at the "end"* of the card,
usually 4, with names and different prioritys in fstab so that
the one closest to the end of the card is used first,
and next will be the next one in and so on
Names so that it will not matter which slot that it is plugged into
When it goes bad, then rename it badXX,
and then the card is still good, just a bit smaller
When testing (to see if bad), do the mkswap -c 3 times to test all? of the cells
(because of controller re-mapping)
*end: You don't know where the controller maps the specific
cells, it is hidden from your view
***NOTE*** because of only 8 slots in /dev/ you can only go to p7
The zero slot is for the whole card ie /dev/mmcblk0p8 will not be accessable
Would this be good way to test SD cards for durability? With the right test program?